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IEEE MASS 2006
Technical Program Committee Mostafa Ammar, Georgia Institute of Technology, USA Stefano Basagni, Northeastern University, USA Douglas Blough, Georgia Tech University, USA Guohong Cao, Pennsylvania State University, USA Ionut Cardei, Florida Atlantic University, USA Mihaela Cardei, Florida Atlantic University, USA Shigang Chen, University of Florida, USA Xiuzhen Cheng, George Washington Univ, USA Sunghyun Choi, Seoul National University, Korea Marco Conti, IIT-CNR, Italy Jun-Hong Cui, University of Connecticut, USA Fei Dai, North Dakota State University, USA Sajal Das, UniversityTexas at Arlington, USA Jing Deng, University of New Orleans, USA Stephan Eidenbenz, Los Alamos National Laboratory, USA Eylem Ekici, Ohio State University, USA Tamer ElBatt, HRL Laboratories, LLC, USA Ozgur Ercetin, Sabanci University, Turkey Pierre Fraigniaud, Université Paris-Sud, France J.J. Garcia-Luna-Aceves, University of California at Santa Cruz, USA Hrishikesh Gossain, Motorola, Inc., USA Indranil Gupta, University of Illinois, Urbana-Champaign, USA Hossam Hassanein, Queens University, Canada Wendi Heinzelman, University of Rochester, USA Thomas Hou, Virginia Tech, USA Imad Jawhar, United Arab Emirates University, United Arab Emirates Holger Karl, University of Paderborn, Germany Simon Koo, University of San Diego, USA Sastri Kota, Harris Corporation, USA Sung-Ju Lee, HP Labs, USA Victor Leung, The University of British Columbia, Canada Baochun Li, University of Toronto, Canada Jie Li, University of Tsukuba, Japan Li Li, Bell Labs, Lucent Technologies, USA Xiang-Yang Li, Illinois Institute of Technology, USA Jorg Liebeherr, University of Virginia, USA Jiangchuan Liu, Simon Fraser University, Canada Jie Liu, Microsoft Research, USA Renato Lo Cigno, Universita` di Trento, Italy Wei Lou, Hong Kong Polytechnic University, Hong Kong Chenyang Lu, Washington University in St. Louis, USA Haiyun Luo, University of Illinois at Urbana-Champaign, USA Brian Mark, George Mason University, USA Martin Mauve, Heinrich-Heine Universität Düsseldorf, Germany Matt Mutka, Michigan State University, USA Koji Nakano, Hiroshima University, Japan Panos Papadimitratos, EPFL, Switzerland Ravi Prakash, University of Texas at Dallas, USA Dipankar Raychaudhuri, Rutgers Univ., USA Sumit Roy, University of Washington, USA Pedro M. Ruiz Martinez, University of Murcia, Spain Curt Schurgers, University of California, San Diego, USA Tara Small, University of Toronto, Canada Ivan Stojmenovic, University of Ottawa, Canada Violet Syrotiuk, Arizona State University, USA Vahid Tarokh, Harvard University, USA Shahrokh Valaee, University of Toronto, Canada Pramod Varshney, Syracuse University, USA Athanasios Vasilakos, Foundation for Research and Technology-Hellas, Greece Cedric Westphal, Nokia Research Center, USA Adam Wolisz, Technical University of Berlin, Germany Vincent Wong, University of British Columbia, Canada Dapeng Oliver Wu, University of Florida, USA Hongyi Wu, University of Louisiana at Lafayette, USA Kui Wu, University of Victoria, Canada Li Xiao, Michigan State University, USA Yang Xiao, The University of Alabama, USA Dong Xuan, Ohio State University, USA Guoliang Xue, Arizona State University, USA Shanchieh Yang, Rochester Institute of Technology, USA Yang Yang, University College London (UCL), United Kingdom Qing-An Zeng, University of Cincinnati, USA Qiang Zhang, Hong Kong University of Science and Technology, Hong Kong Weihua Zhuang, University of Waterloo, Canada Albert Zomaya, University of Sydney, Australia |